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  5. VOL 43, NO 1 (2021)
  6. pp. 28-45

The Self-Checking Concurrent Error-Detection Systems Synthesis Based on the Boolean Complement to the Bose-Lin Codes with the Modulo Value M = 4

D.V. Efanov, Doctor of Science (Tech.)
Federal State Autonomous Educational Institution of Higher Education
“Russian University of Transport”
Russian Federation, 127994, Moscow, Obraztsova str., build. 9/9,
contact phone number (+7) (911) 709 21 64, e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.
V.V. Sapozhnikov, Doctor of Science (Tech.),
Vl.V. Sapozhnikov, Doctor of Science (Tech.),
Federal State Budgetary Educational Institution of Higher Education
“Emperor Alexander I St. Petersburg State Transport University”
Russian Federation, 190031, St. Petersburg, Moskovsky ave., 9,
contact phone number (+7) (812) 457 85 79, e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.

Èlektron. model. 2021, 43(1):28-45

ABSTRACT

The presented paper is devoted to the development of the Boolean complement method for the organization of the self-checking concurrent error-detection (CED) systems for digital devices. The article considers the features of using the modular sum codes (Bose-Lin codes) for these purposes, especially the Bose-Lin code by the modulo M = 4. This code has two check bits and only four different check vectors, this makes it easier to use it in the organization of the self-checking CED system. The article presents the block diagrams of the organization of the CED system by the method of Boolean complement to the considered modular sum code. The examples of the CED system synthesis by the Boolean complement method are given. The article defines the restrictions imposed on the CED systems synthesis procedure, and also forms an algorithm for synthesizing a self-checking CED systems by the method of the Boolean complement to the Bose-Lin code by the modulo M = 4.

KEYWORDS

self-checking discrete device; self-checking concurrent error-detection systems; duplication method; Boolean complement method; Bose-Lin code; testability.

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