V.V. Sapozhnikov, Vl.V. Sapozhnikov, D.V. Efanov, D.A. Nikitin
ABSTRACT
The new class of codes with summation with the improved characteristics of error detection in data bits in comparison with the known codes with summation is considered. Properties of the new class of codes are established, allowing the practical choosing of the best variant of coding at the organization of concurrent error detection system. A method of synthesis of generators for new codes and ways of simplification of generators schemes are described.
KEYWORDS
concurrent error detection, undetectable error, data bits, Berger code, weightbased code with summation, code properties, generator, checker.
REFERENCES
1. McCluskey E.J. Logic Design Principles: With Emphasis on Testable Semicustom Circuits. — N.J.: Prentice Hall PTR, 1986. –– 549 p.
2. Sogomonyan E.S., Slabakov E.V. Self-Checking Devices and Fault-Tolerant Systems. — Moscow.: Radio and Telecommunication, 1989. — 208 p. (in Russian).
3. Lala P.K. Self-Checking and Fault-Tolerant Digital Design. — San Francisco: Morgan Kaufmann Publishers, 2001.— 216 p.
4. NicolaidisM., Zorian Y. On-Line Testing for VLSI—A Compendium of Approaches // Journal of Electronic Testing: Theory and Applications.—1998.—Vol. 12, No 2.— P. 7—20.
5. Gîessel M., Ocherethy V., Sogomonyan E., Marienfield D. New Methods of Concurrent Checking: Edition 1. — Dordrecht: Springer Science+Business Media, 2008. – 184 p.
6. Ubar R., Raik J., Vierhaus H.-T. Design and Test Technology for Dependable Systemson-Chip (Premier Reference Source) // Information Science Reference, Hershey — New York: IGI Global, 2011.— 578 p.
7. Wang L-T., Stroud C.E., Touba N.A. System-on-Chip Test Architectures: Nanometer Design for Testability.— Morgan Kaufmann Publishers, 2008. —856 p.
8. Fujiwara E. Code Design for Dependable Systems: Theory and Practical Applications. — John Wiley & Sons, 2006.— 720 p.
9. Dutta A., Touba N.A. Synthesis of Non-Intrusive Concurrent Error Detection Using an Even Error Detection Function // International Test Conf. (ITC).— 2005.— P. 1059—1066.
10. Sapozhnikov V.V., Sapozhnikov Vl.V. Self-Checking Discrete Devices. — St.-Petersburg: Energoatomizdat, 1992.— 224 p. (in Russian).
11. Aksjonova G.P. Necessary and Sufficient Conditions for the Construction of a Fully Testable Circuits Convolution on Modulo 2 // Automation and Remote Control.—1979.—Nî 9.— P. 126—135 (in Russian).
12. Richter M., Goessel M. Concurrent Checking With Split-Parity Codes // Proc. of the 15th IEEE International On-Line Testing Symposium (IOLTS). — Portugal, Sesimbra-Lisabon, June 24—26, 2009.— P. 159—163.
13. Saposhnikov V.V., Saposhnikov Vl.V., Dmitriev A.V. et al. Organization of Concurrent Error Detection Systems for Combinational Circuits by the Method of Logic Complement // Electronic Modeling.— 2002.— Vol. 24, No 6. — P. 52—66 (in Russian).
14. Parkhomenko P.P., Sogomonyan E.S. Technical Diagnosis Fundamentals (Diagnostic Algoritm Optimization, Apparatus Means). — Moscow: Energoatomizdat, 1981. — 320 p. (in Russian).
15. Romaschenko A.E., Rumyantsev A.Yu., Shen A. Notes in Coding Theory. – Moscow:MTsNMO, 2011.— 80 p. (in Russian).
16. Matrosova A.Yu., Butorina N.B., Yakimova, N.O. Checker Design Based on Monotonous Function Implementation // Proc. Higher Educ. Inst., Physics.—2013.—Vol. 56, No 9/2.—P. 171—173 (in Russian).
17. GîesselM.,Morozov A.A., Sapozhnikov V.V., Sapozhnikov Vl.V. Synthesis of Self-Checking Combinational Circuits Based on Self-Dual Functions // Automation and Remote Control. — 2000.— No 2. — P. 151—163 (in Russian).
18. Berger J.M. A Note on Error Detection Codes for Asymmetric Channels // Information and Control.— 1961.— Vol. 4, Iss. 1. —P. 68—73.
19. Efanov D.V., Saposhnikov V.V., Saposhnikov Vl.V. On Summation Code Properties in Functional Control Circuits // Automation and Remote Control.—2010.—No 6.—P. 155—162 (in Russian).
20. Blyudov A.A., Efanov D.V., Saposhnikov V.V., Saposhnikov Vl.V. Formation of the Berger Modified Code with Minimum Number of Undetectable Errors of Informational Bits // Electronic Modeling.— 2012.— Vol. 34, No 6. — P. 17—29 (in Russian).
21. Efanov D., Sapozhnikov V., Sapozhnikov Vl., Blyudov A. On the Problem of Selection of Code with Summation for Combinational Circuit Test Organization // Proc. of 11th IEEE East-West Design & Test Symposium (EWDTS'2013). — Rostov-on-Don, Russia, September 27—30, 2013.— P. 261—266.
22. Blyudov A., Efanov D., Sapozhnikov V., Sapozhnikov Vl. Properties of Code with Summation for Logical Circuit Test Organization // Proc. of the 10th IEEE East-West Design & Test Symposium (EWDTS'2012). — Kharkov, Ukraine, September 14—17, 2012. — P. 114—117.
23. Sapozhnikov V.V., Sapozhnikov Vl.V., Gîessel M., Morozov A.A. Method of Construction of Combinational Self-Checking Devices With Detection of All Single Faults // Electronic Modeling.— 1998.— Vol. 20, No 6. — P. 70—80 (in Russian).
24. Morosow A., Saposhnikov V.V., Saposhnikov Vl.V., Goessel M. Self-Checking Combinational Circuits with Unidirectionally Independent Outputs // VLSI Design.—1998.—Vol. 5, Iss. 4. — P. 333—345.
25. Das D., Touba N.A. (1999) Weight-Based Codes and Their Application to Concurrent Error Detection of Multilevel Circuits // Proc. of the 17th IEEE VLSI Test Symposium.—USA, CA, Dana Point, April 25—29, 1999. — P. 370—376.
26. Ghosh S., Lai K.W., Jone W.B., Chang S.C. Scan Chain Fault Identification Using Weight-Based Codes for SoC Circuits // Proc. of the 13th Asian Test Symposium. — Taiwan, Kenting, November 15—17, 2004.— P. 210—215.
27. Das D., Touba N.A., Seuring M., Gossel M. Low Cost Concurrent Error Detection Based on Modulo Weight-Based Codes // Proc. of the 6th IEEE International On-Line Testing Workshop (IOLTW). — Spain, Palma de Mallorca, July 3—5, 2000. — P. 171—176.
28. Sapozhnikov V.V., Sapozhnikov Vl.V., Efanov D.V., Nikitin D.A. Method of Constructing the Berger Code with High Error Detecting Efficiency in Information Bits // Electronic Modeling.—2013.— Vol. 35, No 4. — P. 21—34 (in Russian).
29. Sapozhnikov V.V., Sapozhnikov Vl.V., Efanov D.V. Weight-Based Codes with Summation for Checking of Digital Devices Organization // Ibid.—2014.—Vol. 36, No 1.—P. 59—80 (in Russian).
30. Marouf M.A., Friedman D. Design of Self-Checking Checkers for Berger Codes // Proc. of the 8th Annual Intern. Conf. on Fault-Tolerant Computing.—Toulouse.— France, 1978.—P. 179—183.
31. Piestrak S.J. Design of Self-Testing Checkers for Unidirectional Error Detecting Codes.—Wrocaw: Oficyna Wydawnicza Politechniki Wrocavskiej, 1995. — 111 p.
32. Yang S. Logic Synthesis and Optimization Benchmarks User Guide: Version 3.0 / Technical Report Microelectronics Center of North Carolina, P.O. Box 12889, Research Triangle Park, NC 27709, January, 15, 1991.— 44 p.
33. Bose B., Lin D.J. Systematic Unidirectional Error-Detection Codes // IEEE Trans. Comput. — 1985.— Vol. C-34. — P. 1026—1032.
34. Blyudov A.A., Efanov D.V., Sapozhnikov V.V., Sapozhnikov Vl.V. Summation Codes for Organization of Control of Combinational Circuits // Automation and Remote Control. — 2013.— No 6. — P. 153—164 (in Russian).
35. Blyudov A.A., Efanov D.V., Sapozhnikov V.V., Sapozhnikov Vl.V. On Codes with Summation of Data Bits in Concurrent ErrorDetection Systems // Ibid.—2014.—No 8.—P. 131—145 (in Russian).
36. Matrosova A.Yu., Ostanin S.A., Singh V. Detection of False Paths in Logical Circuits by Joint Analysis of the AND/OR Trees and SSBDD-Graphs // Ibid. —2013.—No 7.—P. 126—142 (in Russian).
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