О. Vdovichenko, V. Kharchenko
Èlektron. model. 2025, 47(1):53-76
https://doi.org/10.15407/emodel.47.01.053
ABSTRACT
The article investigates the models of controlled multilevel degradation (CMD), reliability, and survivability of programmable devices (PDs). The known platforms of PDs and their potential capabilities for reconfiguration in case of failures are considered and classified. A preliminary assessment for each type of PDs is given, the nature of their reconfigurability (RA) is investigated, and appropriate metrics for analyzing RA are proposed.
The models of components, faults, and reconfiguration procedures in case of failures that lead to a functioning quality reduction of the PDs are proposed. The structural reliability schemes for reconfiguration procedures are analyzed. A formal definition of the CMD and the conditions for its implementation is given. The multifragment Markov’s models for calculating the availability function of the PD with CMD are described. The sequence of analysis and determination of RA metrics is proposed. Examples for analyzing of real PDs with CMD are analyzed.
KEYWORDS
programmable devices, reliability models, reconfiguration, multilevel controlled degradation, reconfigurability, metrics.
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